Atomistic observation of a crack tip approaching coherent twin boundaries

نویسندگان

  • L. Liu
  • J. Wang
  • S. K. Gong
  • S. X. Mao
چکیده

Coherent twin boundaries (CTBs) in nano-twinned materials could improve crack resistance. However, the role of the CTBs during crack penetration has never been explored at atomic scale. Our in situ observation on nano-twinned Ag under a high resolution transmission electron microscope (HRTEM) reveals the dynamic processes of a crack penetration across the CTBs, which involve alternated crack tip blunting, crack deflection, twinning/detwinning and slip transmission across the CTBs. The alternated blunting processes are related to the emission of different types of dislocations at the crack tip and vary with the distance of the crack tip from the CTBs.

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عنوان ژورنال:

دوره 4  شماره 

صفحات  -

تاریخ انتشار 2014